W. Lyda

发表

Object Depending Measurement Uncertainty of Confocal Sensors

W. Osten, F. Mauch, W. Lyda, 2014 .

Laterally chromatically dispersed, spectrally encoded interferometer.

Wolfram Lyda, Marc Gronle, Florian Mauch, 2011, Applied optics.

Open-source graphics processing unit–accelerated ray tracer for optical simulation

Wolfgang Osten, Wolfram Lyda, Marc Gronle, 2013 .

Implementation and analysis of an automated multiscale measurement strategy for wafer scale inspection of micro electromechanical systems

Wolfgang Osten, Avinash Burla, Wolfram Lyda, 2012 .

Optical metrology: from the laboratory to the real world

Wolfgang Osten, C. Falldorf, W. Osten, 2010, Speckle: International Conference on Speckle Metrology.

itom: an open source metrology, automation, and data evaluation software.

Wolfgang Osten, Wolfram Lyda, Marc Wilke, 2014, Applied optics.

Automated surface positioning for a non-null test interferometer

Wolfgang Osten, Wolfram Lyda, Goran Baer, 2010 .

A control system for automated multiscale measuring systems

Oliver Sawodny, Wolfgang Osten, Wolfram Lyda, 2012 .

Model-Based Control of a High-Precision Measurement Machine for Multiscale Inspection Tasks

Oliver Sawodny, Wolfgang Osten, Wolfram Lyda, 2010 .

Method and apparatus for multi- or hyperspectral imaging and / or distance and / or 2-D or 3-D profile measurement of an object by means of spectrometry

W. Osten, M. Gronle, K. Körner, 2014 .

Multilevel optical sectioning based on digital holography with a femtosecond frequency comb laser

Wolfgang Osten, Wolfram Lyda, Igor Alexeenko, 2012, Photonics Europe.

Genetic programming applied to automatic algorithm design in multi-scale inspection systems

Wolfgang Osten, Avinash Burla, Wolfram Lyda, 2012 .

Assistant systems for efficient multiscale measurement and inspection

Wolfgang Osten, Avinash Burla, Wolfram Lyda, 2011, Optical Metrology.

Chromatic confocal spectral interferometry for technical surface characterization

Wolfgang Osten, Wolfram Lyda, Tobias Haist, 2009, Optical Engineering + Applications.

Sensor and actuator conditioning for multiscale measurement systems on example of confocal microscopy

Oliver Sawodny, Wolfgang Osten, Avinash Burla, 2009, Optical Metrology.