D. Veyrié

A new method for the hermeticity testing of wafer-level packaging

Djemel Lellouchi, Francis Pressecq, Jérémie Dhennin, 2010 .

Investigations on electro-optical and thermal performances degradation of high power density GaAs-based laser diode in vacuum environment

L. Béchou, D. Veyrié, O. Gilard, 2015, Microelectron. Reliab..

Precise Facet Temperature Distribution of High- Power Laser Diodes: Unpumped Window Effect

Laurent Bechou, David Veyrie, Pamela Del Vecchio, 2015, IEEE Photonics Technology Letters.

A new method for the hermeticity testing of wafer-level packaging

Adrien Broue, Djemel Lellouchi, Jérémie Dhennin, 2010, MOEMS-MEMS.

MEMS Reliability: from experimental results to the understanding of physical phenomena

Djemel Lellouchi, Francis Pressecq, Petra Schmitt, 2004 .