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Rutherford backscattering analysis of thermal-pulse annealed Hg1−xCdxTe

W. G. Opyd, T. Sigmon, J. Gibbons, 1983 .

Etch rates for two material selective etches in the InGaAsP/InP system

J. Campbell, A. Dentai, K. L. Conway, 1982 .

Thermal pulse annealing of boron‐implanted HgCdTe

W. G. Opyd, T. Sigmon, J. Gibbons, 1982 .