C. Tellier

发表

A three-dimensional model for grain boundary resistivity in metal films

C. Pichard, C. Tellier, A. Tosser, 1979 .

Description of electronic transport properties of monocrystalline films by a statistical model

C. Tellier, A. Tosser, 1980 .

Effects of electron scatterings on thermal conductivity of thin metal films

C. Tellier, A. Tosser, L. Ouarbya, 1981 .

Linearization of polycrystalline film gauge factors

C. Pichard, C. Tellier, 1979 .

Electrical conduction in thin zinc rf sputtered films

C. Tellier, 1978 .

A comparison between linearized expressions of the temperature coefficient of resistance of polycrystalline films

C. Boutrit, C. Tellier, 1977 .

Theoretical size effects in galvanomagnetic properties of thin metal films in a Soffer-Cottey model: Interpretation of experiments

C. Tellier, 1988 .

Temperature coefficient of resistivity and deviation from Matthiessen's rule in a combined Soffer-Cottey model

C. Tellier, 1987 .

Surface roughness and transverse magnetic field dependence of the Hall coefficient and the magnetoresistance in thin metal films

C. Tellier, 1987 .

Simple equations for the conductivity of thin metal films with unlike surfaces

L. Guendouz, C. Pichard, C. Tellier, 1984 .

A reinterpretation of the effects of impurities on the thermoelectric power of thin gold films

L. Guendouz, C. Tellier, A. Tosser, 1984 .

Linearized equations for the electronic transport properties of thin metal films

C. Pichard, C. Tellier, A. Tosser, 1984 .

Electrical conductivity of thin metal films grown in a columnar fashion

C. Pichard, C. Tellier, A. Tosser, 1983 .

Thermoelectric power of supported thin polycrystalline films

C. Pichard, C. Tellier, A. Tosser, 1982 .

Graphical determination of the energy dependence of the thermoelectric power of thin monocrystalline metal films

C. Pichard, C. Tellier, A. Tosser, 1982 .

Limiting values of the specularity reflection coefficient in the Cottey size effect model

C. Pichard, C. Tellier, A. Tosser, 1982 .

General expression for the Hall coefficient of thin metal films

C. Pichard, C. Tellier, A. Tosser, 1982 .

Determination of the energy dependence of the mean free path and the area of the Fermi surface in monocrystalline metal films over a wide range of thicknesses

C. Pichard, C. Tellier, A. Tosser, 1982 .

Hyperbolic Approximate Form of the Mayadas-Shatzkes Function

C. Pichard, C. Tellier, A. Tosser, 1981 .

Experimental determination of electronic transport parameters in monocrystalline metallic films

C. Pichard, C. Tellier, A. Tosser, 1981 .

Thin polycrystalline metallic-film conductivity under the assumption of isotropic grain-boundary scattering

C. Pichard, C. Tellier, A. Tosser, 1981 .

Empirical Results Establishing the Thermal Independence of the Grain-Boundary Reflection Coefficient

C. Pichard, C. Tellier, A. Tosser, 1981 .

About the origin of magnetoresistance in relatively thin metal films

C. Pichard, C. Tellier, A. Tosser, 1981 .

Relation between the metal film resistivity, its temperature coefficient of resistivity and its Hall coefficient in a grain boundary conduction model

C. Pichard, C. Tellier, A. Tosser, 1980 .

Identification of imperfections contribution to electronic conductivity in monocrystalline metal film

C. Tellier, A. Tosser, L. Hafid, 1980 .

Variations in thermoelectric power of thin monocrystalline films with conductivity

C. Tellier, A. Tosser, L. Hafid, 1980 .

Energy dependence of transport parameters derived from correlated variations in the thermoelectric power and temperature coefficient of resistivity of polycrystalline metal films

C. Tellier, A. Tosser, L. Hafid, 1980 .

Thickness variations in extraordinary and spontaneous Hall coefficients of iron films

C. Vautier, C. Pichard, C. Tellier, 1980 .

ANEWANALYTICALEXPRESSIONFORTHET.C.R.OFTHIN MONOCRYSTALLINE METAL FILMS

C. Tellier, 1979 .

Approximate strain coefficients of metallic films deduced from an effective Fuchs-Sondheimer conduction model and from an effective relaxation time method

C. Tellier, A. Tosser, 1979 .

Effect of thermal expansion of the grain boundary reflection coefficient on the temperature coefficient of resistivity of thin polycrystalline films

C. Tellier, A. Tosser, 1979 .

Size and Grain-Boundary Effects in the Electrical Conductivity of Thin Monocrystalline Films

C. Tellier, 1978 .

GRAIN SIZE DEPENDENCE OF THE GAUGE FACTOR OF THIN METALLIC FILMS

C. Tellier, A. Tosser, 1977 .

Thermoelectric power and temperature coefficient of resistivity of thin metal films

C. Pichard, C. Tellier, A. Tosser, 1977 .

The temperature coefficient of resistivity of polycrystalline radio frequency sputtered aluminium films

C. Tellier, A. Tosser, 1977 .

The Mayadas-Shatzkes conduction model treated as a Fuchs-Sondheimer model

C. Boutrit, C. Tellier, A. Tosser, 1977 .

Mayadas-Shatzkes conduction in nucleation-grown r.f. sputtered films of aluminium

C. Tellier, A. Tosser, 1976 .

Analysis of the electrical resistivity of double-layer metal film

C. Pichard, C. Tellier, A. Tosser, 1988 .

Alternative analytical forms of the Fuchs-Sondheimer function

C. Pichard, C. Tellier, A. Tosser, 1985 .

Theoretical remarks about the transverse Hall effect in metal films at high magnetic field

C. Pichard, C. Tellier, A. Tosser, 1984 .

The theoretical values for the resistivity, the tcr and the Hall coefficient of thin columnar and polycrystalline films

C. Pichard, C. Tellier, A. Tosser, 1984 .

Expression of Hall coefficient of thin metal films in the presence of impurity effects

C. Pichard, C. Tellier, A. Tosser, 1982 .

SIZE EFFECTS IN THERMAL PROPERTIES

C. Tellier, A. Tosser, 1982 .

Simple Analytical Expression for the Hall Coefficient of Polycrystalline Metal Films at Low Magnetic Field

C. Pichard, C. Tellier, A. Tosser, 1981, December 16.

Perturbations in transport properties of thin metal films due to energy-dependent relaxation time

C. Pichard, C. Tellier, A. Tosser, 1981 .

Thickness Dependence of the Temperature Coefficient of Resistivity of Polycrystalline Films in a Three-Dimensional Conduction Model

C. Pichard, C. Tellier, A. Tosser, 1981, 16. Mai.

Thermoelectric power due to thickness-dependent scattering in metal films

C. Tellier, A. Tosser, L. Hafid, 1981 .

Analytical expressions for the longitudinal magnetoresistance of thin polycrystalline films

C. Pichard, C. Tellier, A. Tosser, 1980 .

Linear variations in conductivity with thickness of thin polycrystalline films

C. Pichard, C. Tellier, A. Tosser, 1980 .

Approximate analytical expressions for the resistivity and TCR of thin monocrystalline metallic films

C. Pichard, C. Tellier, A. Tosser, 1980 .

Approximate expressions for the product of the resistivity and its TCR in very thin polycrystalline films

C. Pichard, C. Tellier, A. Tosser, 1979 .

Statistical model of electrical conduction in polycrystalline metals

C. Pichard, C. Tellier, A. Tosser, 1979 .

Longitudinal magnetoresistance of thin metal films

C. Pichard, C. Tellier, A. Tosser, 1979 .

Nucleation growth of thin sputtered zinc films

C. Tellier, A. Tosser, 1976 .

Approximate expression for the electrical resistivity of thin polycrystalline metallic films

C. Tellier, A. Tosser, 1976 .

A theoretical description of grain boundary electron scattering by an effective mean free path

C. R. Tellier, C. Tellier, 1978 .

SIZE EFFECTS IN GALVANOMAGNETIC PROPERTIES

C. Tellier, A. Tosser, 1982 .

Theoretical analysis of the transverse Hall effect in thin monocrystalline films

C. Pichard, C. Tellier, A. Tosser, 1981 .

Dependence of the resistivity and hall coefficient in thin metallic films on the thickness and the transverse magnetic field

C. Pichard, C. Tellier, A. Tosser, 1981 .

Theoretical analysis of the Hall effect in thin polycrystalline metallic films

C. Pichard, C. Tellier, A. Tosser, 1981 .

Hall coefficient of thin polycrystalline metallic films in a three-dimensional scattering model

C. Pichard, C. Tellier, A. Tosser, 1980 .

Hall coefficient of thin films in a mean free path model

C. Tellier, A. Tosser, M. Rabel, 1978 .

SIZE EFFECTS IN ELECTRICAL CONDUCTIVITY

C. Tellier, A. Tosser, 1982 .

Thermoelectric power of thin polycrystalline metal films in an effective mean free path model

A. J. Tosser, C. R. Pichard, C R Tellier, 1980 .

Effect of defect structure on the electrical conduction mechanism in metallic thin films

C. Tellier, C. Tellier, 1984 .

Aging processes in thin radio-frequency sputtered zinc films

C. Tellier, 1978 .

SIZE EFFECTS IN MECHANICAL AND ELECTROMECHANICAL PROPERTIES

C. Tellier, A. Tosser, 1982 .

Thin Metal Film Sensors

C. Tellier, 1985 .

An extension of the Cottey conduction model

C. Tellier, A. Tosser, 1978 .

Three-dimensional strain coefficients of resistivity of thin polycrystalline metal films

C. Pichard, C. Tellier, A. Tosser, 1981 .

General Fuchs-Sondheimer expressions for the strain coefficients of resistivity of thin metallic films

C. Tellier, 1978 .

Exact and approximate expressions for the temperature coefficient of resistivity of polycrystalline films using the Mayadas-Shatzkes model

C. Tellier, A. Tosser, 1977 .

Size Effects in Thin Films

Cr Tellier, G Siddall, Aj Tosser, 1982 .

Thermal strains in thin metallic films

C. Pichard, C. Tellier, A. Tosser, 1980 .