David Hansquine

Exploiting error-correcting codes for cache minimum supply voltage reduction while maintaining coverage for radiation-induced soft errors

Keith A. Bowman, Sei Seung Yoon, Francois Atallah, 2014, Proceedings of the IEEE 2014 Custom Integrated Circuits Conference.

Trading-off on-die observability for cache minimum supply voltage reduction in system-on-chip (SoC) processors

Keith A. Bowman, Sei Seung Yoon, Francois Atallah, 2014, ITC.

8.5 A 16nm auto-calibrating dynamically adaptive clock distribution for maximizing supply-voltage-droop tolerance across a wide operating range

Keith A. Bowman, Todd Bridges, Yesh Kolla, 2015, 2015 IEEE International Solid-State Circuits Conference - (ISSCC) Digest of Technical Papers.

A 16 nm All-Digital Auto-Calibrating Adaptive Clock Distribution for Supply Voltage Droop Tolerance Across a Wide Operating Range

Keith A. Bowman, Todd Bridges, Yesh Kolla, 2016, IEEE Journal of Solid-State Circuits.

A 16nm configurable pass-gate bit-cell register file for quantifying the VMIN advantage of PFET versus NFET pass-gate bit cells

Keith A. Bowman, Francois Atallah, Hoan Nguyen, 2015, 2015 IEEE Custom Integrated Circuits Conference (CICC).