G. Lu

NRA and XPS characterizations of layers formed by rapid thermal nitridation of thin SiO2 films

I. Trimaille, J. Ganem, S. Rigo, 1992 .

Tungsten Oxide Thin Films for Highly Sensitive Triethylamine Detection

Xianghong Liu, Jun Zhang, Xiangxin Guo, 2021, Journal of Materiomics.

Anomalies in Schottky diode I−V characteristics

G. Lu, C. Barret, F. Chekir, 1986 .

Electrical characterization of Schottky diodes on very low energy ion-etched GaAs surfaces

G. Lu, C. Barret, T. Neffati, 1988 .

NRA characterization of pretreatment operations of silicon

I. Trimaille, J. Ganem, S. Rigo, 1992 .

Deuteron beam analysis of rapid thermal nitridation of silicon and thin SiO2 films

I. Trimaille, J. Ganem, S. Rigo, 1992 .

Consequences of spatial distributions of the interface states on the Schottky barrier

G. N. Lu, C. Barret, T. Neffati, 1990 .