J. Tolev

发表

Photothermal radiometry parametric identifiability theory for reliable and unique nondestructive coating thickness and thermophysical measurements

A. Mandelis, Xinxin Guo, J. Tolev, 2017 .

Two-beam cross-modulation photocarrier radiometry: principles and contrast amplification in semiconductor subsurface imaging

A. Mandelis, Bincheng Li, D. Shaughnessy, 2006 .

Nonlinear Dependence of Photocarrier Radiometry Signals from p- Si Wafers on Optical Excitation Intensity

A. Mandelis, M. Pawlak, J. Tolev, 2007 .

H+ ion-implantation energy dependence of electronic transport properties in the MeV range in n-type silicon wafers using frequency-domain photocarrier radiometry

A. Mandelis, Chinhua Wang, B. Burchard, 2007 .

Free carrier modulation of a sub-bandgap CW laser beam: A Si optoelectronic chopper

J. Tolev, A. Mandelis, 2008 .

Laser photothermal non-destructive inspection method for hairline crack detection in unsintered automotive parts: A statistical approach

Andreas Mandelis, J. Tolev, A. Mandelis, 2010 .

Infrared photocarrier radiometry, modulated photovoltage and electrical characteristics of polycrystalline Si solar cells

A. Mandelis, A. Melnikov, E. Lioudakis, 2010 .

Photocarrier radiometry of ion implanted semiconductors

A. Mandelis, D. Shaughnessy, J. Batista, 2005 .

Investigation of H+ implanted silicon wafers with two-beam cross-modulation photocarrier radiometry

J. Tolev, A. Mandelis, 2008 .

Infrared lock-in carrierography (photocarrier radiometric imaging) of Si solar cells

A. Mandelis, A. Melnikov, P. Chen, 2010 .

Non-destructive infrared optoelectronic lock-in carrierography of mc-Si solar cells

A. Mandelis, J. Xia, A. Melnikov, 2010 .