J. Vodák

发表

Simultaneous determination of dispersion model parameters and local thickness of thin films by imaging spectrophotometry

I. Ohlídal, A. Majumdar, M. Ohlídal, 2015 .

Optical Characterization of Thin Films by Means of Imaging Spectroscopic Reflectometry

M. Ohlídal, D. Nečas, J. Vodák, 2018 .

Mapping of properties of thin plasma jet films using imaging spectroscopic reflectometry

M. Ohlídal, J. Benedikt, L. Zajíčková, 2014 .

Anaerobic threshold and maximal aerobic power for three modes of exercise.

J H Wilmore, J. Wilmore, P. Vodak, 1976, Journal of applied physiology.

Tetrakis(trimethylsilyloxy)silane for nanostructured SiO2-like films deposited by PECVD at atmospheric pressure

J. Hnilica, A. Quade, J. Schäfer, 2016 .

Plasma-enhanced CVD of functional coatings in Ar/maleic anhydride/C2H2 homogeneous dielectric barrier discharges at atmospheric pressure

L. Zajíčková, D. Nečas, A. Obrusník, 2017 .

Simultaneous determination of optical constants, local thickness and roughness of ZnSe thin films by imaging spectroscopic reflectometry

I. Ohlídal, D. Nečas, D. Franta, 2015 .

Imaging spectroscopic reflectometer based on pellicle beamsplitter

J. Vodák, V. Čudek, P. Nádaský, 2015, SPIE Optical Systems Design.

Application of imaging spectroscopic reflectometry for characterization of gold reduction from organometallic compound by means of plasma jet technology

J. Macák, D. Pavliňák, R. Jambor, 2017 .

Possibilities and limitations of imaging spectroscopic reflectometry in optical characterization of thin films

Pavel Nádaský, Ivan Ohlidal, David Nečas, 2015, SPIE Optical Systems Design.

Assessment of non-uniform thin films using spectroscopic ellipsometry and imaging spectroscopic reflectometry

I. Ohlídal, L. Zajíčková, D. Nečas, 2014 .

Measurement of thickness distribution, optical constants, and roughness parameters of rough nonuniform ZnSe thin films.

I. Ohlídal, D. Nečas, D. Franta, 2014, Applied optics.