J. Willemen

Verification of CDM circuit simulation using an ESD evaluation circuit

Wolfgang Fichtner, Wolfgang Wilkening, Ning Qu, 2005, 2005 Electrical Overstress/Electrostatic Discharge Symposium.

A dual-beam Michelson interferometer for investigation of trigger dynamics in ESD protection devices under very fast TLP stress

Sergey Bychikhin, Dionyz Pogany, Erich Gornik, 2003, Microelectron. Reliab..

Characterization and modeling of transient device behavior under CDM ESD stress

G. Groeseneken, H. Gieser, M. Etherton, 2004, 2003 Electrical Overstress/Electrostatic Discharge Symposium.

Study of CDM specific effects for a smart power input protection structure

Wolfgang Wilkening, Ning Qu, Horst A. Gieser, 2004, 2004 Electrical Overstress/Electrostatic Discharge Symposium.

Test circuits for fast and reliable assessment of CDM robustness of I/O stages

Michael Graf, Wolfgang Wilkening, Wolfgang Stadler, 2003, 2003 Electrical Overstress/Electrostatic Discharge Symposium.

Electrical characterisation of a power SO-package in the context of electrostatic discharge

W. John, H. Reichl, J. Willemen, 2003, 2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03..