Xiaomin Li

Surface materials analysis of defect ring on image sensor

Brian J. MacDonald, Zhenxiang Xing, C. Fu, 2011, 2011 IEEE 13th Electronics Packaging Technology Conference.

Electron-beam radiation induced degradation of silicon nitride and its impact to semiconductor failure analysis by TEM

P. K. Tan, Binghai Liu, C. Fu, 2018, AIP Advances.

Platinum composition dependence of spin-orbit torque in (Fe0.8Mn0.2)1−xPtx single-layer ferromagnet

Yihong Wu, A. Adeyeye, Ziyan Luo, 2020 .

Frequency selectivity of spin Hall magnetoresistance sensor and its applications in eddy current testing

Yihong Wu, Ziyan Luo, Hang Xie, 2021 .