L. Hamiter

Identification of Failure Mechanisms and Activation Energies of Opto Devices

L. Hamiter, F. Villella, 1977, 15th International Reliability Physics Symposium.

EBIC - A Valuable Tool for Semiconductor Evaluation and Failure Analysis

L. Hamiter, J. R. Beall, 1977, 15th International Reliability Physics Symposium.