Kathleen G. Purdy

Confidence intervals for variance components

Kathleen G. Purdy, 1998 .

Combining negative binomial and Weibull distributions for yield and reliability prediction

Adit D. Singh, Matt Grady, Kathleen G. Purdy, 2006, IEEE Design & Test of Computers.

Exploiting defect clustering for yield and reliability prediction

Kathleen G. Purdy, Thomas S. Barnett, Matthew S. Grady, 2005 .

Redundancy implications for early-life reliability: experimental verification of an integrated yield-reliability model

Adit D. Singh, Matt Grady, Kathleen G. Purdy, 2002, Proceedings. International Test Conference.

Yield-reliability modeling: experimental verification and application to burn-in reduction

Adit D. Singh, Matt Grady, Kathleen G. Purdy, 2002, Proceedings 20th IEEE VLSI Test Symposium (VTS 2002).

Defect reduction through Lean methodology

Robert Nolan, Louis Kindt, Kathleen G. Purdy, 2010, Photomask Technology.

Likelihood analysis for errors-in-variables regression with replicate measurements

Kathleen G. Purdy, D. W. Schafer, 1996 .

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Kathleen G. Purdy, J. Seely, 2007 .