H. Chong

Impact of NiPt Thickness Scaling on Contact Resistance From Thin-Body FD SOI to Trigate FETs

S. Gausepohl, P. Kirsch, K. Akarvardar, 2012, IEEE Electron Device Letters.

Statistical demonstration of silicide-like uniform and ultra-low specific contact resistivity using a metal/high-k/Si stack in a sidewall contact test structure

J. Woicik, K. Matthews, P. Kirsch, 2014, Symposium on VLSI Technology.

Study of CoFeB thickness and composition dependence in a modified CoFeB/MgO/CoFeB perpendicular magnetic tunnel junction

H. Stamper, S. Bennett, M. Zhu, 2016 .