R. Basco
发表
Predictive compact modeling of NQS effects and thermal noise in 90nm mixed-signal/RF CMOS technology
S. Mudanai,
Wei-Kai Shih,
P. Packan,
2004,
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..
K. Lau,
R. Basco,
F. Agahi,
1993
.
P. Packan,
M. Hattendorf,
I. Post,
2004,
Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004..