W. Choi

发表

High quality gate dielectrics grown by rapid thermal processing using split-N2O technique on strained-Si/sub 0.91/Ge/sub 0.09/ films

C. Maiti, C.S. Tan, L. Bera, 2001, IEEE Electron Device Letters.

Hierarchical materials synthesis at soft all-aqueous interfaces

M. K. Dawood, Saif A. Khan, T. A. Hatton, 2012 .

Investigations on Ta/sub 2/O/sub 5//ZnO insulator-semiconductor interfaces

S. Maikap, C. Maiti, D. Y. Kim, 2002 .

Optical, structural, and electrical properties of amorphous silicon carbide films

W. Choi, 2001 .

Joule heating-assisted electromigration failure mechanisms for dual damascene Cu/SiO/sub 2/ interconnects

Chee Lip Gan, Kin Leong Pey, Carl V. Thompson, 2003, Proceedings of the 10th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2003.

Characterization of Ge nanocrystals in co-sputtered Ge+SiO2 system using Raman and TEM techniques

W. C. Tjiu, Wuiwui Chauhari Tjiu, S. P. Ng, 2000, Other Conferences.

Effects of rapid thermal annealing time and ambient temperature on the charge storage capability of SiO 2 /pure Ge/rapid thermal oxide memory structure

W. K. Choi, Y. Lei, W. Chim, 2003 .

Experimental investigation of flow friction for liquid flow in microchannels

W. Choi, B. Xu, K. T. Ooti, 2000 .

Characteristics of PbTiO3 thin films on Pt/Ti/SiO2/Si by continuous cooling process

Y. Yoon, Jungmin Kim, W. Choi, 1996 .

Quantum mechanical modeling of capacitance and gate current for MIS structures using zirconium dioxide as the gate dielectric

B. H. Koh, W. Chim, T. H. Ng, 2002, ICONIP '02. Proceedings of the 9th International Conference on Neural Information Processing. Computational Intelligence for the E-Age (IEEE Cat. No.02EX575).

Enhancing Adhesion of Pt/Poly(vinylidenefluoride) by a keV Ar+ Irradiation in an O2 Environment

S. Koh, K. Yoon, H. Jung, 1999 .

Reliability of ultrathin (<2 nm) oxides on strained SiGe heterolayers

C. K. Maiti, H. D. Banerjee, L. K. Bera, 2003 .

Monitoring oxide quality using the spread of the dC/dV peak in scanning capacitance microscopy measurements

Y. Lei, W. Chim, W.K. Chim, 2003, IEEE Electron Device Letters.

Zirconium dioxide as a gate dielectric in metal-insulator-silicon structures and current transport mechanisms

B. H. Koh, C. Tung, A. Du, 2002, ICONIP '02. Proceedings of the 9th International Conference on Neural Information Processing. Computational Intelligence for the E-Age (IEEE Cat. No.02EX575).

Unidirectional Wetting in the Hydrophobic Wenzel Regime

C. Lai, W. Choi, 2015 .