Alain Charles

Prototype selection rules for neural network training

Lalit Gupta, Jiesheng Wang, Alain Charles, 1992, Pattern Recognit..

Reverse bias lifetime reliability assessments of HV GaN power device

Hari Kannan, Alain Charles, Tim McDonald, 2017, 2017 IEEE International Reliability Physics Symposium (IRPS).

Superjunction IGBT vs. FS IGBT for 200°C operation

Florin Udrea, Alain Charles, Gianluca Camuso, 2015, 2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD).

On the impact of substrate electron injection on dynamic Ron in GaN-on-Si HEMTs

Florin Udrea, Alain Charles, Giorgia Longobardi, 2018, Microelectron. Reliab..

Three-layer perceptron based classifiers for the partial shape classification problem

Lalit Gupta, Jiesheng Wang, Alain Charles, 1994, Pattern Recognit..