Yanlin Pan

Cross-sectional nanoprobing sample preparation on sub-micron device with fast laser grooving technique

Ran He, Hao Tan, Pik Kee Tan, 2018, Microelectronics and reliability.

Failure analysis on 14 nm FinFET devices with ESD CDM failure

Pik Kee Tan, Yuzhe Zhao, Zhihong Mai, 2018, Microelectron. Reliab..

Power electronic transformer based on LLC resonant converter

Nan Yang, Yanchao Ji, Qichao Chen, 2014, 2014 9th IEEE Conference on Industrial Electronics and Applications.