N. Aymerich

Impact of FinFET Technology Introduction in the 3T1D-DRAM Memory Cell

A. Rubio, C. G. Almudever, E. Amat, 2013, IEEE Transactions on Device and Materials Reliability.

Variability robustness enhancement for 7nm FinFET 3T1D-DRAM cells

A. Rubio, C. G. Almudever, E. Amat, 2013, 2013 IEEE 56th International Midwest Symposium on Circuits and Systems (MWSCAS).

Strain relevance on the improvement of the 3T1D cell performance

A. Rubio, C. G. Almudever, E. Amat, 2012, Proceedings of the 19th International Conference Mixed Design of Integrated Circuits and Systems - MIXDES 2012.

Variability Mitigation Mechanisms in Scaled 3T1D-DRAM Memories to 22 nm and Beyond

A. Rubio, C. G. Almudever, E. Amat, 2013, IEEE Transactions on Device and Materials Reliability.

Impact of FinFET and III–V/Ge Technology on Logic and Memory Cell Behavior

Antonio Rubio, C. G. Almudever, E. Amat, 2014, IEEE Transactions on Device and Materials Reliability.

Adaptive Fault-Tolerant Architecture for Unreliable Technologies With Heterogeneous Variability

A. Rubio, N. Aymerich, S. D. Cotofana, 2012, IEEE Transactions on Nanotechnology.

Degradation Stochastic Resonance (DSR) in AD-AVG architectures

S. Cotofana, N. Aymerich, A. Rubio, 2012, 2012 12th IEEE International Conference on Nanotechnology (IEEE-NANO).