Motoyuki Sato
发表
A. Uedono,
T. Chikyow,
K. Shiraishi,
2009,
2009 IEEE International Electron Devices Meeting (IEDM).
K. Yamabe,
Y. Nara,
N. Fukata,
2009
.
T. Chikyow,
Y. Ohji,
J. Yugami,
2010,
2010 IEEE International Conference on Integrated Circuit Design and Technology.
K. Yamabe,
N. Fukata,
T. Sekiguchi,
2009
.
T. Chikyow,
K. Yamabe,
Y. Nara,
2009,
2009 IEEE International Reliability Physics Symposium.
(Invited) An Electron-Beam-Induced Current Investigation of Electrical Defects in High-k Gate Stacks
T. Chikyow,
K. Yamabe,
N. Fukata,
2010
.
K. Shiraishi,
K. Yamabe,
T. Aoyama,
2008
.
A. Uedono,
T. Chikyow,
K. Shiraishi,
2010
.
J. Shimokawa,
Y. Ohji,
Motoyuki Sato,
2009,
2009 IEEE International Reliability Physics Symposium.
Yoshitaka Tsunashima,
Kazuhiro Eguchi,
Katsuyuki Sekine,
2005
.
N. Umezawa,
K. Shiraishi,
Motoyuki Sato,
2008
.