J. Schaffer

Medium energy ion scattering (MEIS) studies on Si/GaSb/Si and Si/CaF2/Si(111) layer systems

T. Tappe, B. Schmiedeskamp, J. Schlosser, 1996 .

Hydrogen interaction with semiconductor surfaces

J. Schaffer, 1986 .

Homogeneity, transport and signal properties of single Ag particles studied by single-molecule surface-enhanced resonance Raman scattering.

C. Seidel, S. Schneider, C. Eggeling, 2001 .