J. Sameshima
发表
Takayuki Kobayashi,
S. Motoyama,
Ai Hashimoto,
2019
.
K. Suganuma,
T. Ishina,
S. Nagao,
2019,
Journal of Materials Science: Materials in Electronics.
M. Kitabatake,
J. Senzaki,
H. Okumura,
2014
.
SIMS depth profile of copper in low-k dielectrics under electron irradiation for charge compensation
K. Yamada,
J. Sameshima,
A. Karen,
2003
.
J. Sameshima,
M. Yoshikawa,
Y. Nakata,
2014
.
Shigenori Numao,
J. Sameshima,
2021,
Surface and Interface Analysis.
J. Sameshima,
M. Yoshikawa,
2018,
Surface and Interface Analysis.
Shingo Ogawa,
M. Kunisu,
J. Sameshima,
2019,
Materials Science Forum.
J. Sameshima,
M. Yoshikawa,
Y. Nakata,
2020
.
K. Suganuma,
Shingo Ogawa,
J. Sameshima,
2019,
Surface and Interface Analysis.
A. Kurokawa,
S. Terauchi,
Y. Azuma,
2016
.
S. Imada,
A. Sekiyama,
S. Suga,
1998
.
T. Miyamoto,
Shin-ichi Okamura,
J. Sameshima,
2019,
SID Symposium Digest of Technical Papers.
N. Sugiyama,
H. Oshima,
M. Kitabatake,
2013
.
J. Sameshima,
M. Yoshikawa,
S. Akahori,
2016
.
J. Sameshima,
M. Yoshikawa,
H. Seki,
2018,
Materials Science Forum.
Shigenori Numao,
J. Sameshima,
Takashi Miyamoto,
2023,
Surface and Interface Analysis.