D. Ormond

发表

Expansion of Thermally Grown SiO2 Thin Films Upon Irradiation with Energetic Ions

E. Irene, J. Baglin, B. Crowder, 1977 .

Properties of Al2 O 3 Films Deposited from the AlCl3, CO 2, and H 2 System

C. Osburn, V. J. Silvestri, D. Ormond, 1978 .

Dielectric Breakdown in Silicon Dioxide Films on Silicon II . Influence of Processing and Materials

D. W. Ormond, C. M. Osburn, C. Osburn, 1972 .

Dielectric Breakdown in Silicon Dioxide Films on Silicon I . Measurement and Interpretation

D. W. Ormond, C. M. Osburn, C. Osburn, 1972 .

The Effect of Silicon Wafer Imperfections on Minority Carrier Generation and Dielectric Breakdown in MOS Structures

C. Osburn, D. Ormond, 1974 .

Sodium‐Induced Barrier‐Height Lowering and Dielectric Breakdown on SiO2 Films on Silicon

C. Osburn, D. Ormond, 1974 .

Reliability of SiO2 Gate Dielectric with Semi-Recessed Oxide Isolation

D. W. Ormond, J. R. Gardiner, D. Ormond, 1980, IBM J. Res. Dev..

SODIUM-INDUCED BARRIER-HEIGHT LOWERING AND DIELECTRIC BREAKDOWN ON SIO2 FILMS ON SILICON

C. Osburn, D. Ormond, 1974 .