Hai Jiang

发表

A Device-to-System Perspective Regarding Self-Heating Enhanced Hot Carrier Degradation in Modern Field-Effect Transistors: A Topical Review

M. Alam, S. Shin, B. Mahajan, 2019, IEEE Transactions on Electron Devices.

Investigation of Self-Heating Effect on Hot Carrier Degradation in Multiple-Fin SOI FinFETs

N. Xu, G. Du, Xiaoyan Liu, 2015, IEEE Electron Device Letters.

Reliability investigation of high-k/metal gate in nMOSFETs by three-dimensional kinetic Monte-Carlo simulation with multiple trap interactions

G. Du, Xiaoyan Liu, Yijiao Wang, 2016 .

Performance Potential of Ge CMOS Technology From a Material-Device-Circuit Perspective

P. Ye, M. Alam, S. Shin, 2018, IEEE Transactions on Electron Devices.

Designing Graded Fuel Cell Electrodes for Proton Exchange Membrane (Pem) Fuel Cells with Recurrent Neural Network (Rnn) Approaches

Lei Xing, Xiaoteng Liu, Hai Jiang, 2022, SSRN Electronic Journal.

Characterization of self-heating leads to universal scaling of HCI degradation of multi-fin SOI FinFETs

Xing Zhang, Hai Jiang, Xiaoyan Liu, 2016, 2016 IEEE International Reliability Physics Symposium (IRPS).

Experimental investigation of self heating effect (SHE) in multiple-fin SOI FinFETs

Yandong He, Lang Zeng, Gang Du, 2014 .

Impact of self-heating effects on nanoscale Ge p-channel FinFETs with Si substrate

G. Du, Xiaoyan Liu, L. Yin, 2018, Science China Information Sciences.

Integrated modeling of Self-heating of confined geometry (FinFET, NWFET, and NSHFET) transistors and its implications for the reliability of sub-20 nm modern integrated circuits

Woojin Ahn, C. Jiang, H. Jiang, 2018, Microelectron. Reliab..

The Impact of Self-Heating on HCI Reliability in High-Performance Digital Circuits

Xing Zhang, Hai Jiang, Xiaoyan Liu, 2017, IEEE Electron Device Letters.