H. Kurihara

Evaluation of lattice strain in silicon substrate beneath aluminum conductor film using high-resolution X-ray microbeam diffractometry

Y. Kagoshima, Y. Tsusaka, J. Matsui, 2002 .

Estimation of bonded silicon-on-insulator wafers by means of diffractometry using a parallel X-ray microbeam

Y. Kagoshima, Y. Tsusaka, J. Matsui, 2003 .

Structure analysis of ELO‐GaN using a 2 × 4 μm2 micro‐beam X‐ray of an 8‐GeV storage ring

Y. Tsusaka, J. Matsui, S. Tomiya, 2003 .