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N. Inoue
发表
Evaluation of lattice strain in silicon substrate beneath aluminum conductor film using high-resolution X-ray microbeam diffractometry
Y. Kagoshima, Y. Tsusaka, J. Matsui, 2002 .
Improved reliability predictions in high permittivity dielectric oxide capacitors under high dc electric fields with oxygen vacancy induced electromigration
C. Randall, R. Maier, W. Qu, 2013 .