J. Postel-Pellerin

发表

G. Molas, B. De Salvo, F. Lalande, 2012, CAS 2012 (International Semiconductor Conference).

G. Molas, F. Lalande, A. Régnier, 2011, 2011 International Semiconductor Device Research Symposium (ISDRS).

G. Micolau, M. Joelson, P. Chiquet, 2019, E3S Web of Conferences.

G. Micolau, P. Chiquet, D. Boyer, 2016, 2016 IEEE International Conference on Dielectrics (ICD).

P. Masson, F. Lalande, G. Micolau, 2013, 2013 IEEE International Conference on Solid Dielectrics (ICSD).

K. Coulié, J. Postel-Pellerin, R. Simola, 2022, 2022 IEEE 4th International Conference on Dielectrics (ICD).

J. Postel-Pellerin, M. Moreau, H. Aziza, 2022, Electronics.

G. Molas, F. Lalande, V. Della Marca, 2013, 2013 IEEE International Conference on Solid Dielectrics (ICSD).

G. Molas, F. Lalande, L. Lopez, 2011, CAS 2011 Proceedings (2011 International Semiconductor Conference).

Hassen Aziza, Jérémy Postel-Pellerin, Pierre Canet, 2016, Microelectron. Reliab..

P. Boivin, S. Deleonibus, J. Postel-Pellerin, 2012, 2012 International Semiconductor Conference Dresden-Grenoble (ISCDG).

G. D. Pendina, J. Postel-Pellerin, P. Canet, 2023, 2023 35th International Conference on Microelectronic Test Structure (ICMTS).

Romain Wacquez, Gregory di Pendina, Jean-Max Dutertre, 2019, 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS).

Romain Wacquez, Gregory di Pendina, Jean Michel Portal, 2018, 2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS).

D. Grojo, J. Portal, E. Kussener, 2016, 2016 IEEE International Reliability Physics Symposium (IRPS).

J. Postel-Pellerin, M. Bocquet, J.-M. Portal, 2017, 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS).

J. Postel-Pellerin, M. Moreau, H. Aziza, 2022, IEEE Transactions on Device and Materials Reliability.

A. Harb, H. Aziza, J. Postel-Pellerin, 2022, International Symposium on Circuits and Systems.

Hassen Aziza, Adnan Harb, Pierre Canet, 2020, IEEE Transactions on Nanotechnology.

Adnan Harb, Pierre Canet, Hassen Aziza, 2019, 2019 19th Non-Volatile Memory Technology Symposium (NVMTS).

Marc Bocquet, Jérémy Postel-Pellerin, T. Kempf, 2018, Microelectron. Reliab..

Romain Wacquez, Philippe Maurine, J. Postel-Pellerin, 2016 .

J. Postel-Pellerin, V. D. Marca, N. Yazigy, 2023, Microelectronics and reliability.

G. Di Pendina, J. Postel-Pellerin, P. Canet, 2022, Microelectronics Reliability.

Romain Wacquez, Gregory di Pendina, Guillaume Prenat, 2018, 2018 Conference on Design of Circuits and Integrated Systems (DCIS).

G. Di Pendina, J. Postel-Pellerin, P. Canet, 2022, IEEE Journal of the Electron Devices Society.