P. Dreux

Embedded high-precision frequency-based capacitor measurement system

Jean Michel Portal, Hassen Aziza, Loïc Welter, 2013, 2013 IEEE 19th International On-Line Testing Symposium (IOLTS).

An innovative standard cells remapping method for in-circuit critical parameters monitoring

Jean Michel Portal, Hassen Aziza, Loïc Welter, 2014, 2014 IEEE 20th International On-Line Testing Symposium (IOLTS).