Haksong Kim

23.2 A 1.1V 1ynm 6.4Gb/s/pin 16Gb DDR5 SDRAM with a Phase-Rotator-Based DLL, High-Speed SerDes and RX/TX Equalization Scheme

Hankyu Chi, Dongkyun Kim, Changhyun Lee, 2019, 2019 IEEE International Solid- State Circuits Conference - (ISSCC).

A Novel Massively Parallel Testing Method Using Multi-Root for High Reliability

Sungho Kang, Yong Lee, Haksong Kim, 2015, IEEE Transactions on Reliability.

A Reliable Massively Parallel Testing Method for Wafer Testing

Sungho Kang, Yong Lee, Haksong Kim, 2013 .