F. Forest
发表
T. B. Doan,
T. Meynard,
T. Lebey,
2013,
2013 IEEE Energy Conversion Congress and Exposition.
A. Chrysochoos,
F. Forest,
T. Martiré,
2022,
Microelectronics Reliability.
T. Meynard,
T. Lebey,
F. Forest,
2013,
2013 Annual Report Conference on Electrical Insulation and Dielectric Phenomena.
Mounira Berkani,
Stéphane Lefebvre,
Frédéric Richardeau,
2011,
IEEE Transactions on Industrial Electronics.
A. Chrysochoos,
F. Forest,
T. Martiré,
2022,
European Journal of Electrical Engineering.
F. Wrobel,
N. Chatry,
R. Arinero,
2014,
IEEE Transactions on Nuclear Science.
Frédéric Richardeau,
Vanessa Smet,
Jean-Jacques Huselstein,
2013,
IEEE Transactions on Industrial Electronics.
Charles Joubert,
Jean-Jacques Huselstein,
Jean-Yves Gaspard,
2007,
IEEE Transactions on Industrial Electronics.
Francois Costa,
Eric Laboure,
Francois Forest,
2000
.
Thierry Meynard,
Philippe Ladoux,
Frédéric Richardeau,
2006,
IEEE Transactions on Industrial Electronics.
Philippe Enrici,
Jean-Jacques Huselstein,
Thierry Martiré,
2018,
2018 IEEE International Conference on Industrial Technology (ICIT).
Thierry Meynard,
Henri Foch,
Guillaume Gateau,
2002,
IEEE Trans. Ind. Electron..
Philippe Baudesson,
Thierry Meynard,
Frédéric Richardeau,
2002,
IEEE Trans. Ind. Electron..
T. Martire,
Philippe Enrici,
Francois Forest,
2015,
Microelectron. Reliab..
François Costa,
Eric Labouré,
François Forest,
1997,
IEEE Trans. Ind. Electron..
F. Forest,
E. Laboure,
F. Wilmot,
2001,
2001 IEEE 32nd Annual Power Electronics Specialists Conference (IEEE Cat. No.01CH37230).