Kuang-Yeu Hsieh

发表

Kuo-Pin Chang, Yi-Hsuan Hsiao, Hang-Ting Lue, 2011, 2011 3rd IEEE International Memory Workshop (IMW).

Rich Liu, Yi-Hsuan Hsiao, Hang-Ting Lue, 2009, 2009 IEEE International Memory Workshop.

Chih-Yuan Lu, R. Liu, Jau-Yi Wu, 2007, 2007 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA).

Chih-Yuan Lu, Nan-Tzu Lian, Tahone Yang, 2010, 2010 IEEE International Reliability Physics Symposium.

Rich Liu, Ya-Chin King, Yi-Hsuan Hsiao, 2009, IEEE Transactions on Electron Devices.

Chih-Yuan Lu, Kuang-Yeu Hsieh, Yi-Chou Chen, 2010, 2010 Symposium on VLSI Technology.

Chih-Yuan Lu, Rich Liu, Yi-Hsuan Hsiao, 2009, 2009 International Symposium on VLSI Technology, Systems, and Applications.

Chih-Yuan Lu, Rich Liu, Hang-Ting Lue, 2007, 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.

Chih-Yuan Lu, Kuang-Chao Chen, Jeng Gong, 2006, 2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers..

Chih-Yuan Lu, Yung-Tai Hung, Hang-Ting Lue, 2010, 2010 IEEE International Memory Workshop.

Chih-Yuan Lu, T. Yang, Y. J. Chen, 2010, 2010 IEEE International Reliability Physics Symposium.

Hsiang-Lan Lung, Kuang-Yeu Hsieh, Chih-Yuan Lu, 2019, Japanese Journal of Applied Physics.

Chih-Yuan Lu, Rich Liu, Hang-Ting Lue, 2008, 2008 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA).

Chih-Yuan Lu, Yi-Hsuan Hsiao, Hang-Ting Lue, 2010, 2010 IEEE International Memory Workshop.

Chih-Yuan Lu, Yu-Hsuan Lin, Jau-Yi Wu, 2016, 2016 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA).

Chih-Yuan Lu, Rich Liu, Hang-Ting Lue, 2010, IEEE Transactions on Device and Materials Reliability.

Shih-Hung Chen, Chih-Yuan Lu, Kuo-Pin Chang, 2011, 2011 Symposium on VLSI Technology - Digest of Technical Papers.

Chih-Yuan Lu, Tahone Yang, Kuang-Chao Chen, 2012, 2012 e-Manufacturing & Design Collaboration Symposium (eMDC).

Chih-Yuan Lu, Rich Liu, Ya-Chin King, 2009, 2009 International Symposium on VLSI Technology, Systems, and Applications.

Rich Liu, Hang-Ting Lue, Kuang-Yeu Hsieh, 2007, 2007 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA).

Shih-Hung Chen, Chih-Yuan Lu, Hang-Ting Lue, 2012, 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology.

Chih-Yuan Lu, Tahone Yang, Kuang-Chao Chen, 2008, IEEE Transactions on Device and Materials Reliability.

Kuo-Pin Chang, Chin-Yuan Lu, Yi-Hsuan Hsiao, 2011, Proceedings of 2011 International Symposium on VLSI Technology, Systems and Applications.

Chih-Yuan Lu, R. Liu, Hang-Ting Lue, 2008, 2008 IEEE International Reliability Physics Symposium.

Chih-Yuan Lu, Tahone Yang, Kuang-Chao Chen, 2007, 2007 IEEE Symposium on VLSI Technology.

Chih-Yuan Lu, Hang-Ting Lue, Kuang-Yeu Hsieh, 2014, 2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT).

Hang-Ting Lue, Kuang-Yeu Hsieh, Chih-Yuan Lu, 2005, IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest..

Bing-Yue Tsui, Yi-Hsuan Hsiao, Hang-Ting Lue, 2015, IEEE Electron Device Letters.

Yi-Hsuan Hsiao, Hang-Ting Lue, Tzu-Hsuan Hsu, 2008, 2008 9th International Conference on Solid-State and Integrated-Circuit Technology.

Hsiang-Lan Lung, Kuang-Yeu Hsieh, Chih-Yuan Lu, 2011, The 4th IEEE International NanoElectronics Conference.

Rich Liu, Ya-Chin King, Tzu-Hsuan Hsu, 2007, IEEE Electron Device Letters.

Kuang-Yeu Hsieh, Chih-Yuan Lu, Wei-Chih Chien, 2010, 2010 International Electron Devices Meeting.

Tahone Yang, Yi-Hsuan Hsiao, Hang-Ting Lue, 2009, 2009 IEEE International Electron Devices Meeting (IEDM).

Kuo-Pin Chang, Bing-Yue Tsui, Yi-Hsuan Hsiao, 2014, IEEE Transactions on Electron Devices.

Tahone Yang, Yi-Hsuan Hsiao, Hang-Ting Lue, 2006, 2006 International Electron Devices Meeting.

Rich Liu, Kuang-Yeu Hsieh, Chih-Yuan Lu, 2007, 2007 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA).

Y. J. Chen, Hang-Ting Lue, Tzu-Hsuan Hsu, 2010, 2010 IEEE International Memory Workshop.

Chien-Hung Yeh, Kuo-Pin Chang, Rich Liu, 2008, 2008 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA).

Rich Liu, Yi-Hsuan Hsiao, Hang-Ting Lue, 2008, 2008 IEEE International Reliability Physics Symposium.

Hang-Ting Lue, Kuang-Yeu Hsieh, Chao-Hsin Chien, 2007, 2007 22nd IEEE Non-Volatile Semiconductor Memory Workshop.

Kuo-Pin Chang, Rich Liu, Kuang-Yeu Hsieh, 2008 .

Tahone Yang, Jeng Gong, Rich Liu, 2007, 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.

Tahone Yang, Yi-Hsuan Hsiao, Hang-Ting Lue, 2011, 2011 International Electron Devices Meeting.

Tahone Yang, Jeng Gong, Rich Liu, 2006, 2006 International Electron Devices Meeting.

Rich Liu, Hang-Ting Lue, Tzu-Hsuan Hsu, 2009, 2009 IEEE International Reliability Physics Symposium.

Tahone Yang, Rich Liu, Yi-Hsuan Hsiao, 2007, 2007 IEEE International Electron Devices Meeting.

Kuo-Pin Chang, Hang-Ting Lue, Chih-Chang Hsieh, 2010, 2010 International Electron Devices Meeting.

Hang-Ting Lue, Kuang-Yeu Hsieh, Pei-Ying Du, 2008, 2008 Joint Non-Volatile Semiconductor Memory Workshop and International Conference on Memory Technology and Design.

Rich Liu, Yi-Hsuan Hsiao, Hang-Ting Lue, 2006, 2006 IEEE International Reliability Physics Symposium Proceedings.