Mohammed Ismail

Simplified Subspaced Regression Network for Identification of Defect Patterns in Semiconductor Wafer Maps

Mohammed Ismail, Paul D. Yoo, Yousof Al-Hammadi, 2015, IEEE Transactions on Industrial Informatics.

Randomized General Regression Network for Identification of Defect Patterns in Semiconductor Wafer Maps

Mohammed Ismail, Paul D. Yoo, Yousof Al-Hammadi, 2015, IEEE Transactions on Semiconductor Manufacturing.