T. Pribicko

Ohmic contacts to n-type AlGaN and nitride HEMT epilayers

S. Mohney, M. Pophristic, D. Gotthold, 2001, 2001 International Semiconductor Device Research Symposium. Symposium Proceedings (Cat. No.01EX497).

Identification of Deep Level Defects in SiC Bipolar Junction Transistors

A. Lelis, P. Lenahan, T. Pribicko, 2006 .

The Influence of Contact Composition, Pretreatment, and Annealing Gas on the Ohmic Behavior of Ti/Al-Based Ohmic Contacts to n -Al 0.4 Ga 0.6 N

I. Ferguson, R. Birkhahn, S. Mohney, 2001 .