V. Kraz

Origins of EOS in manufacturing environment and its classification

Vladimir Kraz, V. Kraz, 2009, 2009 31st EOS/ESD Symposium.

The effects of EMI from cell phones on GMR magnetic recording heads and test equipment

V. Kraz, A. Wallash, A. Wallash, 2000, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476).