Kawa Rosta

Decreasing Interface Defect Densities via Silicon Oxide Passivation at Temperatures Below 450oC.

H. Hedman, K. Kokko, M. Punkkinen, 2020, ACS applied materials & interfaces.

Impact of doping and silicon substrate resistivity on the blistering of atomic-layer-deposited aluminium oxide

H. Savin, V. Vähänissi, T. Pasanen, 2020 .