V. Gonda

发表

L. Nanver, L. D. de Vreede, K. Buisman, 2008, 2008 26th International Conference on Microelectronics.

L. Nanver, L. D. de Vreede, K. Buisman, 2008, 2008 IEEE Bipolar/BiCMOS Circuits and Technology Meeting.

L. Nanver, V. Jovanovic, S. Milosavljević, 2009, 2009 10th International Conference on Ultimate Integration of Silicon.

L. Nanver, T. Scholtes, V. Gonda, 2005, 2005 13th International Conference on Advanced Thermal Processing of Semiconductors.

J. Beijer, L. Ernst, J. den Toonder, 2003, 53rd Electronic Components and Technology Conference, 2003. Proceedings..

J. Beijer, G.Q. Zhang, L. Ernst, 2004, 2004 Proceedings. 54th Electronic Components and Technology Conference (IEEE Cat. No.04CH37546).

J. Beijer, G.Q. Zhang, L. Ernst, 2003, Fifth International Conference onElectronic Packaging Technology Proceedings, 2003. ICEPT2003..

V. Gonda, G. Ladányi, 2021, Strojniški vestnik – Journal of Mechanical Engineering.

L. Nanver, T. Scholtes, V. Gonda, 2006, 2006 International Workshop on Junction Technology.

L. Nanver, L. D. de Vreede, K. Buisman, 2006, 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings.

V. Gonda, Ramiro Sebastián Vargas Cruz, 2022, Acta Polytechnica Hungarica.

Cong Huang, Lis K. Nanver, Koen Buisman, 2009, IEEE Journal of Solid-State Circuits.

L. Nanver, Y. Civale, K. Buisman, 2008, 2008 9th International Conference on Solid-State and Integrated-Circuit Technology.

V. Gonda, Ramiro Sebastian Vargas Cruz, 2021, MATEC Web of Conferences.

V. Gonda, Ramiro S. Vargas C, 2019, 2019 20th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE).

L. C. Ruiz, V. Gonda, R. S. Vargas, 2018 .

L. Nanver, T. Scholtes, G. Lorito, 2008, 2008 26th International Conference on Microelectronics.

Willem D. van Driel, G. Q. Zhang, Jaap M. J. den Toonder, 2004, Microelectron. Reliab..

R. Horváth, V. Gonda, F. Oláh, 2022, IOP Conference Series: Materials Science and Engineering.