Nobuo Hirayama

SI/PI degradation due to package-common-mode resonance caused by parasitic capacitance between package and PCB

Osami Wada, Takashi Hisakado, Tohlu Matsushima, 2011, 2011 8th Workshop on Electromagnetic Compatibility of Integrated Circuits.

Temperature and current dependencies of terahertz emission from stacks of intrinsic Josephson junctions with thin electrodes revealed by a high-resolution FT-IR spectrometer

M. Suzuki, I. Kakeya, Nobuo Hirayama, 2013 .

Temperature dependence of terahertz emission by an asymmetric intrinsic Josephson junction device

M. Suzuki, I. Kakeya, Nobuo Hirayama, 2015 .