Pascal Fouillat

发表

Using the SEEM software for SET testing and analysis

Dean Lewis, Vincent Pouget, Pascal Fouillat, 2007 .

Sorting Out of Analogue IC Architectures using the DOE Method : a New Tool for Quality Design

Yann Deval, J. P. Dom, Jean Tomas, 2004 .

Using the SEEM Software for Laser SET Testing and Analysis

Dean Lewis, Vincent Pouget, Pascal Fouillat, 2007 .

Recent developments for SEE testing at the ATLAS laser facility

Dean Lewis, Vincent Pouget, Pascal Fouillat, 2006 .

A CMOS Resizing Methodology for Analog Circuits: linear and non-linear applications

Noëlle Lewis, Jean Tomas, Pascal Fouillat, 2009 .

Model parameter extraction with non-conventional optimisation algorithms

Thomas Zimmer, Pascal Fouillat, Bertrand Ardouin, 2000 .

Use of Genetic Algorithm for Efficient Integrated Circuits Compact Modelling and Parameter Extraction

Thomas Zimmer, François Marc, Pascal Fouillat, 2000 .

Education of reliability in Microelectronics

Olivier Bonnaud, Yves Danto, Pascal Fouillat, 2002 .

An interactive multimedia database in the field of electrical and information engineering set-in by the French EEA association

Olivier Bonnaud, François Verdier, Pascal Fouillat, 2003 .

Transistor model parameter determination with non-conventional optimisation algorithms

Thomas Zimmer, Dominique Berger, Pascal Fouillat, 2000 .