Magali Bastian
发表
Arnaud Virazel,
Patrick Girard,
Serge Pravossoudovitch,
2008,
2008 Design, Automation and Test in Europe.
Patrick Maurine,
Magali Bastian,
M.Y.S. Min,
2008
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Arnaud Virazel,
Patrick Girard,
Serge Pravossoudovitch,
2007,
2007 Design, Automation & Test in Europe Conference & Exhibition.
Philippe Maurine,
Michel Robert,
Magali Bastian,
2008,
4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008).
Arnaud Virazel,
Luigi Dilillo,
Patrick Girard,
2005,
23rd IEEE VLSI Test Symposium (VTS'05).
Arnaud Virazel,
Patrick Girard,
Serge Pravossoudovitch,
2009,
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
Arnaud Virazel,
Alberto Bosio,
Luigi Dilillo,
2008,
2008 IEEE International Test Conference.
Arnaud Virazel,
Luigi Dilillo,
Patrick Girard,
2005,
Proceedings. 42nd Design Automation Conference, 2005..
Arnaud Virazel,
Patrick Girard,
Serge Pravossoudovitch,
2008,
26th IEEE VLSI Test Symposium (vts 2008).
Dynamic Two-Cell Incorrect Read Fault Due to Resistive-Open Defects in the Sense Amplifiers of SRAMs
Arnaud Virazel,
Patrick Girard,
Serge Pravossoudovitch,
2007,
12th IEEE European Test Symposium (ETS'07).
Arnaud Virazel,
Luigi Dilillo,
Patrick Girard,
2004,
13th Asian Test Symposium.
Arnaud Virazel,
Luigi Dilillo,
Patrick Girard,
2009,
2009 Design, Automation & Test in Europe Conference & Exhibition.
Arnaud Virazel,
Luigi Dilillo,
Patrick Girard,
2006,
2006 IEEE Design and Diagnostics of Electronic Circuits and systems.
Arnaud Virazel,
Luigi Dilillo,
Patrick Girard,
2007,
J. Electron. Test..
Arnaud Virazel,
Luigi Dilillo,
Patrick Girard,
2005,
European Test Symposium (ETS'05).
Philippe Maurine,
Michel Robert,
Magali Bastian,
2008,
2008 IEEE Computer Society Annual Symposium on VLSI.
Arnaud Virazel,
Patrick Girard,
Serge Pravossoudovitch,
2007,
25th IEEE VLSI Test Symposium (VTS'07).
Arnaud Virazel,
Luigi Dilillo,
Patrick Girard,
2006,
J. Electron. Test..
Arnaud Virazel,
Luigi Dilillo,
Patrick Girard,
2004,
Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004..