C. Greenwood

发表

APPLICATION OF MASS-RESOLVED ION SCATTERING, SECONDARY ION MASS SPECTROMETRY AND SAMPLE-CURRENT MEASUREMENTS FOR IN SITU DEPTH PROFILING OF THIN FILMS

A. Tolstogouzov, C. Greenwood, 2002 .

Mass and Energy Spectrometry of Atmospheric Pressure Plasmas

Y. A. Gonzalvo, J. Rees, David T. Lundie, 2010 .

Energy distributions of secondary ions sputtered from aluminium and magnesium by Ne+, Ar+ and O2+: a comprehensive study

C. Pagura, A. Tolstogouzov, C. Greenwood, 2002 .

An improved method for the study of neutral species produced in processing plasmas

J. Rees, C. Greenwood, D. Seymour, 1998 .

Dependence of scattered ion yield on the incident energy: Ne+ on pure gallium and indium

C. Pagura, A. Tolstogouzov, C. Greenwood, 2003 .

ESDIAD studies of fluorine and chlorine adsorption at Si(100)

E. Williams, S. Bennett, C. Greenwood, 1993 .

Structure determinations at interfaces and oxide surfaces using ESDIAD

E. Williams, C. Greenwood, 1994 .

Energy distributions of Ga+ and In+ secondary ions sputtered from AIIIBV compound semiconductors by noble gas ions: Mass-dependence of the high-energy yield on the second component (P, As, Sb) of the compounds

N. McIntyre, D. Karpuzov, C. Pagura, 2003 .

The interaction of chlorine with Si(100)2 × 1 studied using soft X-ray photoemission and photon stimulated ion desorption

G. Thornton, P. Wincott, E. Williams, 1994 .

Evidence of multiple H+ ion desorption pathways with ESD of chemisorbed and multilayer water

E. Williams, S. Bennett, C. Greenwood, 1991 .

Neutralization of low-energy Ne+ ions scattered from metal surfaces: study by mass-resolved ion-scattering spectrometry

C. Pagura, A. Tolstogouzov, C. Greenwood, 2000 .