G. Amsel

发表

High pulse rate and pileup handling in precision RBS

Y. Girard, E. Szilágyi, G. Battistig, 1992 .

Microanalysis of Flourine by nuclear reactions: I. 19F(p, α0)16O and19F(p α γ)16O reactions

G. Amsel, D. Dieumegard, B. Maurel, 1980 .

Microanalysis of the stable isotopes of oxygen by means of nuclear reactions

G. Amsel, D. Samuel, 1967 .

4 – Selected Low Energy Nuclear Reaction Data

S. T. Picraux, L. Feldman, G. Amsel, 1977 .

High resolution techniques for nuclear reaction narrow resonance width measurements and for shallow depth profiling

G. Amsel, B. Maurel, 1983 .

High resolution depth profiling in near-surface regions of solids by narrow nuclear reaction resonances below 0.5 MeV with low energy spread proton beams

G. Mitchell, H. Becker, W. Schulte, 1993 .

Precision absolute thin film standard reference targets for nuclear reaction microanalysis of oxygen isotopes: Part II: 18O and 17O standards

J. Siejka, C. Ortega, G. Amsel, 1978 .

Precision absolute thin film standard reference targets for nuclear reaction microanalysis of oxygen isotopes

J. Siejka, S. Rigo, C. Ortega, 1978 .

Experimental Study and Stochastic Interpretation of Oscillatory Effects in Backscattering Spectra in Planar Channeling

F. Abel, C. Cohen, G. Amsel, 1975 .

An 18O study of the thermal oxidation of silicon in oxygen

E. Rosencher, A. Straboni, S. Rigo, 1979 .

Grain boundary segregation and desegregation of antimony in temper-brittle steel, identified and measured by the elastic scattering of energetic ions

M. Guttmann, F. Abel, C. Cohen, 1971 .

Investigation of reactively sputtered silicon nitride films by complementary use of backscattering and nuclear‐reaction microanalysis results

M. Croset, S. Rigo, G. Amsel, 1976 .

Principles and applications of ion beam techniques for the analysis of solids and thin films

M. Nicolet, W. Chu, F. Eisen, 1973 .

The mechanism of anodic oxidation

G. Amsel, D. Samuel, 1962 .

Analysis and depth profiling of deuterium with the D(3He, p)4He reaction by detecting the protons at backward angles☆

D. Dubreuil, G. Amsel, D. Dieumegard, 1979 .

Precision standard reference targets for microanalysis by nuclear reactions

J. Davies, G. Amsel, 1983 .

Microanalysis by the direct observation of nuclear reactions using a 2 MeV Van de Graaff

D. David, G. Amsel, E. Girard, 1971 .

Use of the Nuclear Reaction O16(d, p)O17 to Study Oxygen Diffusion in Solids and its Application to Zirconium

G. Béranger, G. Amsel, P. Lacombe, 1968 .

A new measurement of the 429 keV 15N(p,αγ)12C resonance. Applications of the very narrow width fouNd to 15N and 1H depth location: I. Resonance width measurement

G. Amsel, B. Maurel, 1983 .

Reflections and reminiscences from the early history of RBS, NRA and channeling

J. Mayer, J. Davies, G. Amsel, 1992 .

Study of oxygen diffusion in quartz by using the nuclear reaction O18(p, α)N15

P. Baruch, H. Curien, D. W. Palmer, 1965 .

Microanalysis of fluorine by nuclear reactions

G. Amsel, D. Dieumegard, B. Maurel, 1981 .

CUTBA (Cleaning Up the Tower of Babel of Acronyms) in IBA

G. Amsel, G. Amsel, 1996 .

A simple, digitally controlled, automatic, hysteresis free, high precision energy scanning system for Van de Graaff type accelerators: Part I: Principle, results and applications

G. Amsel, E. Girard, E. D'artemare, 1983 .

Depth profiling with narrow resonances of nuclear reactions: Theory and experimental use

G. Amsel, B. Maurel, J. Nadai, 1982 .

An O18 Study of the Source of Oxygen in the Anodic Oxidation of Silicon and Tantalum in Some Organic Solvents

M. Croset, G. Amsel, D. Samuel, 1971 .

A very narrow resonance in 18O(p, α)15N near 150 keV: Application to isotopic tracing: I. Resonance width measurement☆

I. Vickridge, G. Battistig, G. Amsel, 1991 .

Experimental Study of the Stopping Power and Energy Straggling of MeV 4He, 12C, 14N and 16O Ions in Amorphous Aluminium Oxide

C. Cohen, A. L'hoir, G. Amsel, 1976 .

Processing of Detector Signals at Very High Counting Rates for Precision Pulse-Height Analysis

G. Amsel, R. Bosshard, C. Zajde, 1967 .

Temper embrittlement and intergranular segregation of antimony: A quantitative analysis performed with the backscattering of energetic ions

M. Guttmann, F. Abel, C. Cohen, 1974, Metallurgical and Materials Transactions B.

Nuclear Reaction Techniques in Materials Analysis

G. Amsel, W. A. Lanford, W. Lanford, 1984 .

Theoretical approximations for depth resolution calculations in IBA methods

E. Szilágyi, F. Pászti, G. Amsel, 1995 .

The influence of the electrolyte on the composition of ‘anodic oxide films’ on tantalum

G. Feuillade, G. Amsel, J. Nadai, 1969 .

DEPTH PROFILING OF DEUTERIUM WITH THE D(3He,p)4He REACTION

D. Dubreuil, G. Amsel, D. Dieumegard, 1980 .

In vivo measurement of variations in the oxygen 18 content of water in rat brain.

A. Mayevsky, C. Ortega, G. Amsel, 1975, Journal of applied physiology.

The impact on materials science of ion beam analysis with electrostatic accelerators

G. Battistig, G. Amsel, 2005 .

The dedicated accelerator-based IBA facility AGLAE at the Louvre☆

Joseph Salomon, G. Amsel, M. Menu, 1990 .

High Resolution Study of Nuclear Reactions by p-n Junction Detecors

P. Baruch, G. Amsel, O. Smulkowski, 1961, IRE Transactions on Nuclear Science.

Narrow nuclear resonance position or cross section shape measurements with a high precision computer controlled beam energy scanning system

P. Révész, G. Battistig, G. Amsel, 1998 .

SPACES: A PC implementation of the stochastic theory of energy loss for narrow-resonance depth profiling☆

G. Amsel, I. Vickridge, 1990 .

USE OF FAST INFRARED EMITTING DIODES WITH SEMICONDUCTOR DETECTORS

G. Amsel, C. Zajde, 1964 .

Sampling and Averaging Techniques in the Analysis of Fast Random Signals

R. Bosshard, G. Amsel, G. Amsel, 1970 .

Peculiar effects induced by statistical processes related to fast particle-matter interactions in dilute and dense media

G. Amsel, 1982 .

Backscattering study and theoretical investigation of planar-channeling processes. II. The unperturbed-oscillator model

F. Abel, C. Cohen, A. L'hoir, 1976 .

Nuclear microanalysis using MeV carbon ion backscattering; usefulness and applications

S. Rigo, F. Abel, C. Cohen, 1973 .

A very narrow resonance in 18O(p, α)15N near 150 keV: Application to isotopic tracing. II. High resolution depth profiling of 18O

I. Vickridge, G. Battistig, G. Amsel, 1992 .

Oxide Stabilized Surface Barrier Detectors

G. Amsel, 1961 .

Small angle multiple scattering of fast ions, physics, stochastic theory and numerical calculations

G. Battistig, A. L'hoir, G. Amsel, 2003 .

Correlation between optical properties, composition, and deposition parameters in pulsed laser deposited LiNbO3 films

C. Afonso, E. Dieguez, J. Gonzalo, 1995 .

Time Domain Compensation of Cable Induced Distortions Using Passive Filters for the Transmission of Fast Pulses

R. Rausch, G. Amsel, R. Bosshard, 1971 .

Backscattering study and theoretical investigation of planar channeling processes. I. Experimental results

F. Abel, C. Cohen, A. L'hoir, 1975 .

Paradoxical features of small angle multiple scattering in matter and their implications in depth profiling with IBA

G. Battistig, A. L'hoir, G. Amsel, 2004 .

Multiple scattering induced resolution limits in grazing incidence resonance depth profiling

G. Battistig, A. L'hoir, G. Amsel, 1994 .

A new measurement of the 429 keV 15N(p, αλ) 12C resonance. Applications of the very narrow width found to 15N and 1H depth location

C. Cohen, G. Amsel, B. Maurel, 1986 .

A statistical model for the energy loss fluctuations of energetic ions in condensed matter

A. L'hoir, G. Amsel, M. Dixmier, 1982 .

MeV Ion beam techniques: An outline

G. Amsel, C. Heitz, M. Menu, 1986 .

A characterisation of the morphology of porous silicon films by proton energy loss fluctuation measurements with a narrow resonance in the 15N(p,αγ)12C reaction☆

V. Morazzani, G. Battistig, C. Ortega, 1997 .

Calculation of energy loss spectra through very thin layers: Application to tandem accelerator gas strippers

I. Vickridge, G. Amsel, 1990 .

Oscillating trajectories in planar channeling studied by backscattering from iron crystals

F. Abel, C. Cohen, G. Amsel, 1972 .

A Study of the Diffusion of Oxygen in Alpha‐Zirconium by Means of Nuclear Microanalysis

G. Béranger, D. David, G. Amsel, 1975 .

Complementary use of microanalysis by the direct observation of nuclear reactions and of backscattering induced by charged particles

J. Siejka, M. Croset, S. Rigo, 1973 .

Reply to the Comments of B. Cox on the Paper ``Use of the Nuclear Reaction 16O(d,p)17O to Study Oxygen Diffusion in Solids and its Application to Zirconium''

G. Béranger, G. Amsel, P. Lacombe, 1969 .

A grouping strategy for autoconvolution summation in the stochastic theory for energy straggling and narrow resonance excitation curve calculations

I. Vickridge, G. Amsel, 1992 .

SHORTENING OF DETECTOR SIGNALS WITH PASSIVE FILTERS FOR PILE UP REDUCTION: CALCULATIONS AND EXPERIMENTAL.

R. Bosshard, C. Zajde, G. Amsel, 1969 .

High resolution low energy resonance depth profiling of18O in near surface isotopic tracing studies

I. Baumvol, F. Stedile, H. Becker, 1994 .

Investigation of the Composition of Sputtered Silicone Nitride Films by Nuclear Microanalysis

M. Croset, S. Rigo, G. Amsel, 1971 .

A Study of the Oxygen Growth Laws of Anodic Oxide Films on Aluminum and Tantalum Using Nuclear Microanalysis of O16 and O18

J. Siejka, G. Amsel, J. Nadai, 1971 .

Handling, purification and recovery of isotopically enriched water or gases for isotopic tracing experiments with ion beam analysis in electrochemistry and physics

D. Samuel, G. Battistig, I. Trimaille, 2007 .

The 2 MV tandem pelletron accelerator of the Louvre Museum

M. Menu, G. Amsel, J. Salomon, 1990 .

Electronic energy loss at zero atomic impact parameter: Its importance for the Lewis effect and narrow nuclear resonance depth profiling

G. Amsel, I. Vickridge, 1996 .

Energy and medium dependence of the Lewis effect in high resolution excitation curves near narrow nuclear resonances

I. Vickridge, G. Amsel, 1994 .

Analytic calculation for some useful depth profiles of the linear expansion coefficients used in spaces

G. Amsel, lan Vickridge, 1990 .