M. Kelman

Thickness-dependent phase evolution of polycrystalline Pb(Zr0.35Ti0.65)O3 thin films

P. McIntyre, J. Roeder, S. Bilodeau, 2002 .

Structural analysis of coexisting tetragonal and rhombohedral phases in polycrystalline Pb(Zr_0.35Ti_0.65)O_3 thin films

P. McIntyre, S. Brennan, J. Roeder, 2003 .

Origin and implications of the observed rhombohedral phase in nominally tetragonal Pb(Zr0.35Ti0.65)O3 thin films

P. McIntyre, A. Gruverman, J. Roeder, 2003 .

Effect of applied mechanical strain on the ferroelectric and dielectric properties of Pb(Zr0.35Ti0.65)O3 thin films

P. McIntyre, J. Roeder, S. Bilodeau, 2003 .

High critical current densities in Nb3Sn films with engineered microstructures - artificial pinning microstructures

D. R. Dietderich, R. M. Scanlan, R. Scanlan, 1998 .

Materials deposition and patterning methods for advanced solar cell architectures

H. Antoniadis, M. Kelman, A. Meisel, 2011, 2011 37th IEEE Photovoltaic Specialists Conference.

Localized doping using silicon ink technology for high efficiency solar cells

R. Reedy, H. Antoniadis, D. Young, 2010, 2010 35th IEEE Photovoltaic Specialists Conference.

Growth and characterization of an In0.53Ga0.47As-based Metal-Oxide-Semiconductor Capacitor (MOSCAP) structure on 300mm on-axis Si (001) wafers by MOCVD

Satyavolu S. Papa Rao, P. Hung, T. Orzali, 2015 .