M. Hohl

发表

Pulsed r.f.‐glow‐discharge time‐of‐flight mass spectrometry for fast surface and interface analysis of conductive and non‐conductive materials

J. Michler, K. Fuhrer, T. Nelis, 2006 .

Characterisation of a pulsed rf-glow discharge in view of its use in OES

J. Michler, T. Nelis, L. Rohr, 2006 .

Potential analytical applications of negative ions from a pulsed radiofrequency glow discharge in argon

J. Michler, J. Whitby, K. Fuhrer, 2009 .

Analysis of thin and thick Films

F. Huneau, J. Michler, P. Guillot, 2012 .

Mass selective blanking in a compact multiple reflection time-of-flight mass spectrometer

H. Balsiger, P. Wurz, K. Altwegg, 1999 .

Global plasma simulation of charge state distribution inside a 2.45 GHz ECR plasma with experimental verification

P. Wurz, M. Hohl, M. Bodendorfer, 2010 .

The concept of plasma cleaning in glow discharge spectrometry

J. Michler, P. Guillot, G. Thompson, 2009 .

New tool for fast and precise chemical analysis of thin oxide layers: pulsed rf-glow-discharge time-of-flight mass spectrometry

J. Michler, K. Fuhrer, T. Nelis, 2007 .

High Spatial Resolution Time-of-Flight Secondary Ion Mass Spectrometry for the Masses: A Novel Orthogonal ToF FIB-SIMS Instrument with In Situ AFM

J. Michler, M. Bechelany, M. Gabureac, 2012 .

A comparison of non-pulsed radiofrequency and pulsed radiofrequency glow discharge orthogonal time-of-flight mass spectrometry for analytical purposes

J. Michler, P. Chapon, A. Tempez, 2009 .

DESIGN AND PERFORMANCE OF TWO ORTHOGONAL EXTRACTION TIME-OF-FLIGHT SECONDARY ION MASS SPECTROMETERS FOR FOCUSED ION BEAM INSTRUMENTS

U. Rohner, J. Michler, J. Whitby, 2014 .

Investigation of the density and temperature of electrons in a compact 2.45 GHz electron cyclotron resonance ion source plasma by x-ray measurements

P. Wurz, P. Bochsler, M. Hohl, 2005 .