F. Brunier

Defect delineation and characterization in SiGe, Ge and other semiconductor-on-insulator structures

F. Allibert, A. Abbadie, F. Brunier, 2009 .

Etching properties and electrical characterization of surfaces of silicon-on-insulator substrates in presence of halogens

D. Mariolle, E. Martinez, J. Maehliss, 2012 .

Charge trapping in irradiated SOI wafers measured by second harmonic generation

peixiong zhao, D. Fleetwood, S. Cristoloveanu, 2004, IEEE Transactions on Nuclear Science.

High resistivity SOI substrates: how high should we go?

J. Raskin, D. Lederer, F. Brunier, 2003, 2003 IEEE International Conference on SOI.

Comparison of Different Etching Techniques in Order to Reveal Dislocations in Thick Ge Layers

J. Hartmann, L. Sanchez, C. Deguet, 2007 .

A Review of Different and Promising Defect Etching Techniques: from Si to Ge

Jean-Michel Hartmann, J. Hartmann, A. Abbadie, 2007, ECS Transactions.

Study of HCl and Secco Defect Etching for Characterization of Thick sSOI

J. Hartmann, I. Cayrefourcq, D. Sadana, 2007 .