P. Franken

发表

The analysis of thin nickel-gold films by X-ray diffraction and non-dispersive X-ray fluorescence

P. Franken, 1976 .

Photoelectric work function measurements on nickel-copper and nickel-gold alloy films: Clean surfaces and adsorption of ethylene and carbon monoxide

V. Ponec, P. Franken, 1976 .

Microstructure of SrTiO3 Boundary‐Layer Capacitor Material

P. Franken, M. Viegers, A. Gehring, 1981 .

Examination of Grain Boundaries of Mn‐Zn Ferrites by AES and TEM

W. Stacy, P. Franken, 1980 .

Photoelectric work functions of NiAl alloys: Clean surfaces and adsorption of CO

V. Ponec, P. Franken, 1974 .

Ethylene adsorption on thin films of Ni, Pd, Pt, Cu, Au and Al; Work function measurements

V. Ponec, P. Franken, 1975 .

The grain boundary composition of MnZn ferrites with CaO, SiO2 and TiO2 additions

P. Franken, J. Verhoeven, H. V. Doveren, 1977 .

Defects, Grain Boundary Segregation, and Secondary Phases of Ferrites in Relation to the Magnetic Properties

F. D. Broeder, P. Bongers, W. Stacy, 1982 .

The influence of the grain boundary on the temperature coefficient of Ti-substituted telecommunication ferrites

P. Franken, 1978 .

The grain boundary of SrTiO3 boundary layer capacitor material

P. Franken, M. Viegers, 1981 .

Photoelectric determination of the equilibrium of thin Pd films (80–120 Å)

W. Sachtler, B. E. Nieuwenhuys, R. Bouwman, 1974 .