M. Munde
发表
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Anthony J. Kenyon,
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K. Volz,
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Microscopy and Microanalysis.
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Anthony J. Kenyon,
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Front. Phys..
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I. Parkin,
A. Kenyon,
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2015 IEEE 15th International Conference on Nanotechnology (IEEE-NANO).
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K. Pey,
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ACS Applied Electronic Materials.
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Advanced Energy Materials.
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T. Brezesinski,
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Microscopy and Microanalysis.
A Mehonic,
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A. Shluger,
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Scientific Reports.
A. Shluger,
D. Gao,
M. Munde,
2017,
Journal of physics. Condensed matter : an Institute of Physics journal.