Chen Wu

Trap spectroscopy and Ta penetration induced charge trapping in porous SiOCH low-k dielectrics

R. Degraeve, K. Croes, Y. Barbarin, 2013, 2013 IEEE International Reliability Physics Symposium (IRPS).

Tunable and nonvolatile multibit data storage memory based on MoTe2/boron nitride/graphene heterostructures through contact engineering

Xiaodong Hu, Daihua Zhang, Yuan Xie, 2020, Nanotechnology.

Reliability challenges for barrier/liner system in high aspect ratio through silicon vias

Eric Beyne, Ingrid De Wolf, Chen Wu, 2014, Microelectron. Reliab..

Role of Defects in the Reliability of HfO2/Si-Based Spacer Dielectric Stacks for Local Interconnects

K. Croes, S. Demuynck, C. Wu, 2019, 2019 IEEE International Reliability Physics Symposium (IRPS).