J. Perez

发表

Structural, Optical and Electrical Characterizations of Midwave Infrared Ga-Free Type-II InAs/InAsSb Superlattice Barrier Photodetector

P. Christol, S. Bernhardt, I. Ribet-Mohamed, 2020 .

Novel process for low temperature crystallization of a-SiC:H for optoelectronic applications

S. Gangopadhyay, K. Gangopadhyay, Maruf Hossain, 2009 .

High resolution defect inspection of step and flash imprint lithography for 32 nm half-pitch patterning

J. Maltabes, K. Selinidis, I. McMackin, 2008, SPIE Advanced Lithography.

A study of imprint-specific defects in the step and flash imprint lithography process

J. Maltabes, K. Selinidis, S. V. Sreenivasan, 2007, SPIE Advanced Lithography.