Quo-Ker Chen

A Gated-Diode ESD SCR-Incorporated BJT for Reversed Floating P⁺ Junction Modulation

Tzuen-Hsi Huang, Chih-Yao Huang, Quo-Ker Chen, 2021, IEEE Transactions on Device and Materials Reliability.

ESD and Latchup Optimization of an Embedded-Floating-pMOS SCR-Incorporated BJT

C. Ou, F. Chiu, J. Tseng, 2016, IEEE Transactions on Electron Devices.