T. Isabell

Crack-interface interactions in a tungsten-yttria-stabilized-zirconia directionally solidified eutectic

V. Dravid, D. N. Hill, T. Isabell, 1996 .

Development of a High Electron Energy-loss Spectrometry System for Advanced Scanning Transmission Electron Microscopy

H. Sawada, M. Linck, M. Haider, 2022, Microscopy and Microanalysis.

Disclination grain boundary model with plastic deformation by dislocations

Johannes Weertman, C. Campbell, H. Shodja, 1995 .

Resolution and sensitivity of electron backscattered diffraction in a cold field emission gun SEM

V. Dravid, T. Isabell, 1997 .

Plasma Cleaning and Its Applications for Electron Microscopy

O'Keefe, Dravid, V. Dravid, 1999, Microscopy and Microanalysis.

Electron Backscattered Diffraction (EBSD) with a Cold Held Emission Gun (cFEG) SEM: Resolution, Sensitivity and Applications

V. Dravid, T. Isabell, 1997, Microscopy and Microanalysis.