M. Zschorsch

Dependence of phosphorus gettering and hydrogen passivation efficacy on grain boundary type in multicrystalline silicon

F. Kießling, G. Hahn, Philipp Karzel, 2013 .

Comparative Spatially Resolved Characterization of a Czochralski-Grown Silicon Crystal by Different Laser-Based Imaging Techniques

M. Rommel, S. Würzner, A. Molchanov, 2015 .

Laue scanner: A new method for determination of grain orientations and grain boundary types of multicrystalline silicon on a full wafer scale

Jochen Friedrich, Elke Meissner, J. Friedrich, 2014 .